The Electron Microscopy Center offers access to multiple characterization and sample preparation techniques. A Scanning Electron Microscopes (SEM), a Transmission Electron Microscope (TEM), a dual beam (Focused Ion Beam/SEM), a small angle X-ray scattering (SAXS) system and a X-ray Photoelectron Spectroscopy (XPS) system are available at the EMC, in addition to specimen preparation stations (grinding/polishing, conductive coating deposition, dimpling, ion milling/polishing, etc…).
For galleries corresponding to our different capabilities, please choose from the list below.
