The new Bruker Dektak XT surface profiler is now available for use in the Center for Nanoscale Science and Engineering. The profiler quickly measures step heights and surface roughness up to 1 mm high over distances up to 50 mm. The built-in microscope allows alignment to specific features or areas of interest. In addition, the profiler features the 2D stress measurement option for determining thin-film stress and the low force measurement option for accurately characterizing soft samples without damage. The instrument is located in room A368 of the
